FT-330系列普通四探针方阻电阻率测试仪
FT-330 Series common four probe resistance ratio test instrument
一.描述De
采用范德堡测量原理能改善样品因几何尺寸、边界效应、探针不等距和机械游移等外部因素对测量结果的影响及误差，优于同类仪器精度.特别是方块电阻值较小的产品测量，更加准确.提供通讯接口，PC软件数据处理及数据分析.中文或英文语言版本.
Using the Vanderbilt measuring principle can improve the influence and error of external factors on measurement results,such as the geometric size of sample and boundary effect. probe not equidistant and moving machinery. And is superior to similar precision instruments. especially the product measurement of square resistance which value smaller . more accurate. Provide communication interface. PC software data processing and data analysis. In Chinese or English languages.
二.满足标准standard：
硅片电阻率测量的国际标准（ASTM F84）及标准设计制造该仪器设计符合GB/T 1551-2009 《硅单晶电阻率测定方法》、GB/T 1552-1995《硅、锗单晶电阻率测定直流四探针法》.
silicon resistivity measurements of international standards (ASTM F84) and national standard design and manufacture of the equipment is designed in accordance with GB/T 1551-2009 "Method of determination of silicon single crystal resistivity” GB/T 1552-1995. Silicon and germanium single crystal resistivity to determine DC four probe method".
三.适用范围Applicable scope：
适用于生产企业、高等校、科研部门，是检验和分析半导体材料质量的工具；液晶显示，自动测量和系数补偿，并带有温度补偿功能，自动转换量程；采用高精度AD芯片控制，恒流输出，结构合理、质量轻便；选配：PC软件，保存和打印数据，生成报表
suitable for manufacturing enterprises. colleges and universities and scientific research. are the necessary tools for testing and analyzing the quality of semiconductor materials.Liquid crystal display. automatic measurement and coefficient compensation. with temperature compensation function. automatic conversion range.High precision AD chip control. constant current output. reasonable structure and light weight. Optional to buy: PC software. save and print data. generate reports
广泛用于：覆盖膜;导电高分子膜，高、低温电热膜;隔热、防辐射导电窗膜 导电(屏蔽)布、装饰膜、装饰纸;金属化标签、合金类箔膜;熔炼、烧结、溅射、涂覆、涂布层，电阻式、电容式触屏薄膜;电极涂料，其他半导体材料、薄膜材料方阻测试
硅晶块、晶片电阻率及扩散层、外延层、ITO导电箔膜、导电橡胶等材料方块电阻 半导体材料/晶圆、太阳能电池、电子元器件，导电薄膜（ITO导电膜玻璃等），金属膜，导电漆膜，蒸发铝膜，PCB铜箔膜，EMI涂层等物质的薄层电阻与电阻率 导电性油漆，导电性糊状物，导电性塑料，导电性橡胶，导电性薄膜，金属薄膜，抗静电材料， EMI 防护材料，导电性纤维，导电性陶瓷等
It is widely used in:
Covering membrane;Conductive polymer film. high and low temperature electric film.Insulation. anti-radiation conductive film (shielding) cloth. decorative film. decorative paper.Metallized labels and alloy foil films.Smelting. sintering. sputtering. coating. Coating Silicon block. chip resistance rate and diffusion 四.型号及技术参数Models and technical parameters 规格型model FT-331 FT-332 FT-333 FT-334 FT-335 FT-336 1.方块电阻范围Sheet resistance 10-5～2×105Ω/□ 10-4～2×105Ω/□ 10-3～2×105Ω/□ 10-3～2×104Ω/□ 10-2～2×105Ω/□ 10-2～2×104Ω/□ 2.电阻率范围Resistivity 10-6～2×106Ω-cm 10-5～2×106Ω-cm 10-4～2×106Ω-cm 10-4～2×105Ω-cm 10-3～2×106Ω-cm 10-3～2×105Ω-cm 测试电流范围 Test current 0.1μA ，1μA，10μA，100µA，1mA，10mA，100mA 10μA，100µA，1mA，10mA，100mA 0.1μA ，1μA，10μA，100µA，1mA，10mA，100mA 10μA，100µA，1mA，10mA， 100mA 0.1μA，1μA，10μA，100µA，1mA，10mA，100mA 1μA，10μA，100µA，1mA，10mA，100mA 4.电流精度 Current accura ±0.1% ±0.2% ±0.2% ±0.3% ±0.3% ±0.3% 5.电阻精度Resistance ≤0.3% ≤0.3% ≤0.3% ≤0.5% ≤0.5% ≤0.5% 6.显示读数display 液晶显示：电阻、电阻率、方阻、温度、单位换算、温度系数、电流、电压、探针形状、探针间距、厚度 、电导率LCD: resistance. resistivity. sheet resistance. temperature. unit conversion.temperature coefficient. current. voltage. probe shape. probe spacing. thickness. conductivity 7.测试方式test mode 普通单电测量general single electrical measurement 8.工作电源power 输入: AC 220V±10%.50Hz 功 耗：<30w> 9.误差errors 整机不确定性Machine uncertain errors≤4%（标准样片结果 Standard Sample results） 10.选购功能choose to buy 选购1.pc软件； 选购2.方形探头； 选购3.直线形探头； 选购4.测试平台；5.标准电阻 1.pc software; 2. square probe; 3. linear probe; 4. test Platform. 11.测试探头Test probe 探针间距选购：1mm；2mm；3mm三种规格; 探针材质选购：碳化钨针;白钢针；镀金磷铜半球形针Optional probe spacing: 1mm；2mm；3mm in three sizes. Select probe material: tungsten carbide needle. white steel needle. gilded copper hemispherical needles. 配套方案：解决各材料状态 --固态、液态、气态、颗粒状电阻、电阻率、电导率测量 ROOKO瑞柯-------专注于新材料测量与分析仪器解决方案
